テクノロジーの進歩に関する国際ジャーナル
オープンアクセス

概要

New Analysis Methodology to Evaluate the Environmental Factors and the Deterioration of Metallic Surfaces in the Electronics Industry

Francisco Ramírez Moreno, Sebastián Velarde Córdova, Héctor Alejandro Peláez Molina, Homero Jaime Rodríguez Centeno and Gustavo Lopez Badilla

Based on the use of industrial and computing engineering tools, a new method was developed with a VEGAM matrix for the rapid and effective detection of the effects of the environment (climate and air pollution) on equipment and machines used in the electronics industry. This was done with a staff developed by experts from the National Technological Institute based in the Technological Institute of Mexicali, obtaining an efficiency of 95% in its application in the electronic industry of the city of Mexicali.